The Helios 650 FIB-SEM provides high-resolution scanning electron microscopy (SEM), focused ion beam (FIB) milling and etching, energy dispersive X-ray scattering (EDS), and scanning transmission electron microscopy (STEM) capabilities to the COIFPM.  The SEM and FIB resolutions are 0.9 nm and 5 nm, respectively, allowing for high resolution 2D and 3D imaging and elemental analysis of a wide array of samples.  The broad range of capabilities of these microscopes makes them excellent platforms for stand-alone research as well as support tools for other highly specialized laboratory equipment such as the nano-CT scanner and the environmental transmission electron microscope (ETEM).