Ziess UltraXRM-L200 Nano-CT

The Ziess UltraXRM-L200 Nano-CT is capable of non-destructive, high-resolution imaging of samples down to resolutions of 16 nm. The UltraXRM allows for scanning in both phase contrast as well as absorption contrast, enabling enhanced identification of material boundaries which leads to higher accuracy and better segmentation results. By incorporating these non-destructive imaging capabilities with advanced image processing techniques, the tomograms obtained from the UltraXRM can be used for flow modeling as well as in-situ fluid studies on tight, otherwise inaccessible, samples. The COIFPM has several FIB-SEM microscope platforms that streamline sample preparation and take the guesswork out of selecting the appropriate sample site. This enables targeted research on samples of prime interest.